Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) solutions, today announced the completion ...

Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) solutions, today announced the launch of ...

Diamond coatings are considered a key technology for numerous industrial applications—from power electronics to optics to ...

“Mid-infrared ellipsometry offers a powerful approach for non-destructive optical critical dimension (OCD) metrology in advanced semiconductor manufacturing. This technique supports in-line ...

Modern computer chips are complex 3D structures containing dozens of thin layers, each precisely controlled at the atomic scale. A slight thickness variation—less than the width of a single atom—can ...

insights from industryArash MirhamedLead of ISE Support TeamPark Systems In this interview, Arash Mirhamed, lead of the ISE Support Team at Park Systems, explores how imaging spectroscopic ...

Abstract: This work presents an overview of the latest advancements in monochromatic ellipsometry, tracing its evolution from early null ellipsometry to widely commercialized rotating ellipsometry, ...

Polarization describes the orientation of electromagnetic waves as they propagate through space, representing one of light's fundamental properties alongside wavelength and intensity. In spectroscopy, ...

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...